CLEANROOM GARMENTS AND ARTICLES CLEANLINESS TESTING SERVICE
SGS Ultra-Trace Analysis Service center of Semiconductor refers to IEST, ISO, ASTM and other standards to assist clients in avoiding product defective caused by contamination from dust-free articles and provides you with cleanliness confirmation when purchasing.
Dust-free articles for personnel use included dust-free garments, masks, finger cots, shoes, shoe covers, wipes, paper and related articles. If these products are not clean enough or have poor durability, they may easily generate too much dust or produce pollutants such as ions, metals or organic compounds. These products may also cause the adsorption of particles due to the electrostatic effect generated after use. Defective dust-free articles not only affect the performance of the cleanroom but also directly or indirectly affect the equipment and cause product contamination.
SGS provides the following testing services to assist you in better understanding the cleanliness of your dust-free articles.
- NVR, non-volatile residue test
- FTIR, non-volatile organic pollutants test
- Outgas, gas emission test
- Metals & Ions, trace metals and ions contaminant test
- Particle, particle content test
- Helmke drum test
- Dynamic simulated dust emission test in cleanroom
- Rate of sorption and sorbency capacity test
- Solvent resistance test
- Surface static electricity test
- Surface resistance test